Single-shot readout with the radio-frequency single-electron transistor in the presence of charge noise

The radio-frequency single-electron transistor srf-SETd possesses key requirements necessary for reading out a solid state quantum computer. This work explores the use of the rf-SET as a single-shot readout device in the presence of 1 / f and telegraph charge noise. For a typical spectrum of 1/ f noise we find that high fidelity, single-shot measurements are possible for signals Dq .0.01e. For the case of telegraph noise, we present a cross-correlation measurement technique that uses two rf-SETs to suppress the effect of random switching events on readout. We demonstrate this technique by monitoring the charge state of a metal double dot system on microsecond time scales. Such a scheme will be advantageous in achieving high readout fidelity in a solid-state quantum computer. © 2005 American Institute of Physics. fDOI: 10.1063/1.1897423g